https://doi.org/10.1140/epjc/s10052-019-7586-6
Regular Article - Experimental Physics
Broad angular anisotropy of multiple scattering in a Si crystal
1
INFN Sezione di Ferrara, Via Saragat 1, 44124, Ferrara, Italy
2
Dipartimento di Fisica e Scienze della Terra, Università di Ferrara, Via Saragat 1, 44124, Ferrara, Italy
3
Institute for Nuclear Problems, Belarusian State University, Bobruiskaya 11, 220030, Minsk, Belarus
4
Dipartimento di Fisica e Astronomia, Università di Padova, Via Marzolo 8, 35131, Padua, Italy
5
INFN Laboratori Nazionali di Legnaro, Viale dell’Università 2, 35020, Legnaro, Italy
6
INFN Sezione di Milano Bicocca, Piazza della Scienza 3, 20126, Milan, Italy
7
Università dell’Insubria, via Valleggio 11, 22100, Como, Italy
8
Institut für Kernphysik der Universität Mainz, 55099, Mainz, Germany
9
Dipartimento di Scienze Biomediche e Chirugico specialistiche, Università di Ferrara, Via Luigi Borsari 46, 44121, Ferrara, Italy
* e-mail: sytov@fe.infn.it
Received:
24
May
2019
Accepted:
23
December
2019
Published online:
25
January
2020
We observed reduction of multiple Coulomb scattering of 855 MeV electrons within a Si crystalline plate w.r.t. an amorphous plate with the same mass thickness. The reduction owed to complete or partial suppression of the coherent part of multiple scattering in a crystal vs crystal orientation with the beam. Experimental data were collected at Mainz Mikrotron and critically compared to theoretical predictions and Monte Carlo simulations. Our results highlighted maximal 7% reduction of the r.m.s. scattering angle at certain beam alignment with the [100] crystal axes. However, partial reduction was recorded over a wide range of alignment of the electron beam with the crystal up to 15
. This evidence may be relevant to refine the modelling of multiple scattering in crystals for currently used software, which is interesting for detectors in nuclear, medical, high energy physics.
© The Author(s), 2020

