https://doi.org/10.1140/epjc/s10052-025-15105-w
Regular Article - Computing, Software and Data Science
Markov modeling of performance deterioration in irradiated resistive plate chambers
Institute for Power Systems and High Voltage Technology, ETH Zurich, 8092, Zurich, Switzerland
a
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Received:
3
September
2025
Accepted:
21
November
2025
Published online:
4
December
2025
Abstract
This work presents a piecewise deterministic Markov process model for describing performance deterioration in resistive plate chambers (RPC) under uniform background irradiation. The approach accommodates high irradiation rates and arbitrary charge spectra. When applied to the one-dimensional single-cell model of a three-layer single-gap RPC, it shows agreement with state-of-the-art Monte Carlo simulations, which has not been achieved so far. The Markov process model is further applied to the single-cell model with polarizable resistive layers and the two-dimensional counterpart. Moreover, we show that incorporating streamer-like charge events allows the model to reproduce experimental data on efficiency curves under irradiation. These large charge events explain the experimentally observed reduction of the efficiency plateau at high irradiation rates. Extending this insight to eco-friendly gas mixtures reveals that suppressing streamers in general is crucial for achieving high-rate capability.
The original article has been revised: in Eq. 1, the multiplication sign was incorrectly placed between 
and V’. Additionally, on page 4 of 9, left side, in the last sentence of the paragraph following Eq. 16, the unit of α was incorrectly given as pCK
, but should read pC kV and on page 4 of 9, the unit of α was incorrectly given as pCK.
An erratum to this article is available online at https://doi.org/10.1140/epjc/s10052-025-15172-z.
© The Author(s) 2025
modified publication 2025
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